Rigid Body Structure Enables High Precision New Optical System and High-Brightness Illumination
High Performance Multi-Auto Focus
*Improved accuracy
Z-axis measuring accuracy E1Z has been significantly improved by the image auto focus:
・ QV-APEX / QV-STREAM PLUS : (1.5+4L/1000)μm
・ QV-HYPER : (1.5+2L/1000)μm
*Image multi-auto focus
The optimal focus can be selected for each surface texture and measured feature, realizing high reproducibility and reliable edge detection. Structural design is optimized through the use of finite element method (FEM) analysis. This results in maximum rigidity for minimum weight, minimizing deformations due to loading and guaranteeing excellent geometrical accuracy at all times. The bridge and table guideways forming the X and Y axes are connected by a rigid body highly resistant to geometrical deformation. This means the accuracy of each axis is largely unaffected by the other’s movement, making this configuration ideal for high-precision machinery. The optical system has been improved, realizing clearer images and higher edge detection capability.
*Finer resolution
The new design has increased the numerical aperture (NA) of the standard 2.5X lens from a conventional 0.14 to an amazing 0.21, greatly improving brightness and resolution in the process. The high NA and low distortion ensures high accuracy on the screen. In addition, the working distance has increased from the conventional 34 mm to 40.6 mm, thereby improving usability as well.
*Higher brightness
The LED illumination models are equipped with the latest high-brightness LED elements, not only improving the optical system but also increasing the brightness by practically doubling the illumination of the CCD.
*Reduced flare
Flare has been significantly reduced by redesigning the optical system of the objective lens and the variable magnification unit (PPT).
New Optical System Improves Brightness and Resolution Fixed Bridge and Table Configuration High Performance Multi-Auto Focus
*Laser auto focus (LAF)
Mitutoyo offers models featuring the LAF system which enables high-speed focusing. This system allows focusing at 20 mm/ second and thus is optimal for high-speed height measurement. Measurement efficiency is greatly increased when there are many measurement points such as when measuring the heights of connector terminals, for example.
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