Mitutoyo Contracer CV-2100 Contour Measuring System
Remarkable operability and functionality revolutionize contour measuring systems and enable measurement that is fast, accurate, and easy.
Key operation buttons are now mounted onto the X-axis drive unit to reduce set-up time and improve high-volume repetitive measurement processes.
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Easy operation with X-Axis jog shuttle
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Centralized front control panel
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A quick vertical-motion stand with remarkable operability
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Highly efficient measurement
The combination of high accuracy and excellent operability allows for increased support of a wide range of measurement needs.
FORMTRACEPAK Contour Analysis Software offers total support for measurement system control, surface roughness analysis, contour analysis, contour tolerancing, and inspection report creation
